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Microlenses of CMOS image sensor and method for fabricating the same
Microlenses of CMOS image sensor and method for fabricating the same
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机译:CMOS图像传感器的微透镜及其制造方法
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摘要
A method of fabricating microlenses in a CMOS image sensor including at least one of the following steps: Forming a color filter array including a plurality of color filters on a semiconductor substrater. Forming on and/or over the color filter array a flattening layer to compensate for height differences between color filters. Forming a silicon oxide layer on and/or over the flattening layer. Forming on and/or over the silicon oxide layer, a plurality of photoresist patterns which correspond to the color filters, wherein the photoresist patterns may be separated from each other. Forming a plurality of CxFy-based polymer bumps surrounding the plurality of photoresist patterns using at least one process gas (e.g. C5F8, CH2F2, Ar, and/or O2). Etching the plurality of polymer bumps, the plurality of photoresist patterns, and the silicon oxide layer using an etching recipe having substantially the same etching selection ratio between the plurality of polymer bumps, the plurality of photoresist patterns, and the silicon oxide layer.
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机译:一种在CMOS图像传感器中制造微透镜的方法,包括以下步骤中的至少一个:在半导体衬底上形成包括多个滤色器的滤色器阵列。在滤色器阵列上和/或上方形成平坦化层,以补偿滤色器之间的高度差。在平坦化层上和/或上方形成氧化硅层。在氧化硅层上和/或上方形成对应于滤色器的多个光致抗蚀剂图案,其中光致抗蚀剂图案可以彼此分离。使用至少一种处理气体(例如C 5 Sub> F 8 Sub>,CH 2 Sub)形成围绕多个光刻胶图案的多个CxFy基聚合物凸块> F 2 Sub>,Ar和/或O 2 Sub>)。使用在多个聚合物凸块,多个光致抗蚀剂图案和氧化硅层之间具有基本相同的蚀刻选择比的蚀刻配方蚀刻多个聚合物凸块,多个光致抗蚀剂图案和氧化硅层。
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