首页> 外国专利> Detector for devices radiating corpuscular radiation, device radiating corpuscular radiation and method for detecting existence of products interaction within the device

Detector for devices radiating corpuscular radiation, device radiating corpuscular radiation and method for detecting existence of products interaction within the device

机译:用于辐射体辐射的设备的检测器,设备辐射体辐射以及用于检测设备内产品相互作用的存在的方法

摘要

In the present invention, there is disclosed a detector being intended for devices radiating corpuscular radiation and being usable both under ultra-high vacuum conditions and also under pressure above 10e-3 kPa in an examined sample chamber of the corpuscular radiation radiating device. The detector contains a scintillator (3) powered by a high-voltage potential and a light detector (1). The scintillator (3) contains an electrically conductive layer (4) provided in grid or strip shape or an electrically conductive layer (4) permeable for visible light and therefore being capable of detecting both electrons and visible light. The detector is suitable for detecting electrons in ultra-high vacuum and for detecting light at high pressure in the sample chamber (6) because of using different potentials. The device radiating corpuscular radiation, especially screening electron microscope, is provided with the sample chamber (6), in which is variable pressure, an electron optic system for creating a focused electron beam (PE) and said detector. At this method for detection of interaction products existence in the device radiating corpuscular radiation at conditions of varying pressure both light arising in ultra-high vacuum conditions when the products of interaction strike a scintillator (3) and light arising at ambient pressure or low vacuum conditions when the products of interaction interact with gas molecules are detected by the same detector (1) and then evaluated.
机译:在本发明中,公开了一种检测器,该检测器旨在用于辐射体辐射的装置,并且既可以在超高真空条件下,又可以在高于10e-3kPa的压力下在被检查的体辐射装置的样品室中使用。该检测器包含由高压电势驱动的闪烁器(3)和光检测器(1)。闪烁体(3)包含以网格或带状设置的导电层(4)或可透过可见光的导电层(4),因此能够检测电子和可见光。该检测器适用于超高真空中的电子,并且由于使用不同的电势,因此适合于检测样品室(6)中高压的光。辐射微粒辐射的装置,特别是筛查电子显微镜,设有样品室(6),该室是可变压力的;用于产生聚焦电子束(PE)的电子光学系统;以及所述检测器。在该方法中,在相互作用的产物撞击闪烁体(3)时,在超高真空条件下产生的光和在环境压力或低真空条件下产生的光都在检测压力变化的条件下辐射体辐射的设备中是否存在相互作用产物。当相互作用的产物与气体分子相互作用时,由同一检测器(1)进行检测,然后进行评估。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号