首页> 外国专利> METHOD AND APPARATUS ALLOWING SIMULTANEOUS DIRECT OBSERVATION AND ELECTRON CAPTURE OF SCINTILLATION IMAGES IN AN ELECTRON MICROSCOPE

METHOD AND APPARATUS ALLOWING SIMULTANEOUS DIRECT OBSERVATION AND ELECTRON CAPTURE OF SCINTILLATION IMAGES IN AN ELECTRON MICROSCOPE

机译:允许同时进行电子显微镜中闪烁图像的直接观察和电子捕获的方法和装置

摘要

A method and apparatus allowing for simultaneous direct viewing and electronic capture of images in an electron microscope (TEM). For this, the usual opaque direct viewing plate in the TEM is replaced in form and in function by a two-sided direct view- ing plate including at least one scintillator. This plate produces light emissions from both its upper and lower surfaces, which allows an electronic camera below the plate to be used simultaneously with direct human viewing from above the plate. The method and apparatus are also compatible with traditional permanent image recording units that are often desired in such microscopes.
机译:一种允许在电子显微镜(TEM)中同时直接观看和电子捕获图像的方法和设备。为此,TEM中通常不透明的直接观察板在形式和功能上被包括至少一个闪烁器的双面直接观察板所代替。该板从其上表面和下表面均发出光,这使得可以同时使用板下方的电子摄像机,并从板上直接观察人的视线。该方法和设备还与这种显微镜中经常需要的传统永久图像记录单元兼容。

著录项

  • 公开/公告号WO2009117077A3

    专利类型

  • 公开/公告日2009-11-12

    原文格式PDF

  • 申请/专利权人 FAMA LEO A.;MANCUSO JAMES F.;

    申请/专利号WO2009US01650

  • 发明设计人 MANCUSO JAMES F.;FAMA LEO A.;

    申请日2009-03-16

  • 分类号H01J37/22;H01J37/26;

  • 国家 WO

  • 入库时间 2022-08-21 18:41:12

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