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SEMICONDUCTOR DEVICE WITH DEBUGGING FUNCTION, SEMICONDUCTOR OPERATION MONITORING SYSTEM, AND DEBUGGING SIGNAL OUTPUT METHOD

机译:具有调试功能的半导体器件,半导体运行监控系统和调试信号输出方法

摘要

The device is provided with at least one functional block, multiple connection terminals that include an output bus terminal used solely for signal output, an acquisition unit for acquiring an internal signal that shows the operation status of at least one functional block and that is obtained using debugging function, and an output conversion unit to which are input a normal signal output to the output bus terminal and the internal signal, and that generates a debugging signal by superimposing the internal signal on the normal signal and outputs it to the output bus terminal.
机译:该装置具有:至少一个功能块;多个连接端子,其包括仅用于信号输出的输出总线端子;获取单元,用于获取内部信号,该内部信号显示至少一个功能块的操作状态,并通过使用调试功能,以及输出转换单元,将输出到输出总线端子的内部信号和内部信号输入到该输出转换单元,并通过将内部信号叠加在正常信号上来生成调试信号,并将其输出到输出总线端子。

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