首页> 外国专利> Positioning stage, bump forming apparatus equipped with the positioning stage, and bump forming method performed using the positioning stage

Positioning stage, bump forming apparatus equipped with the positioning stage, and bump forming method performed using the positioning stage

机译:定位台,具备该定位台的凸块形成装置以及利用该定位台进行的凸块形成方法

摘要

A positioning stage that can prevent an excessive force from being imparted to a positioned wafer, a bump forming apparatus equipped with such a positioning stage, and a bump forming method performed using such a positioning stage are provided.;A biasing member 26 that biases a wafer 2 towards a positioning member 28 has a contact surface 26s that substantially faces a wafer-holding surface 24a at an angle. The contact surface 26s is in contact with an outer periphery area of the wafer 2 so as to bias the wafer 2 slantwise towards the wafer-holding surface 24a. With a resiliently deformable member 27, the positioning member 28 is brought into contact with the wafer 2 and is held at a positioning position. When a bias force exceeding a predetermined magnitude is imparted to the positioning member 28, the resiliently deformable member 27 becomes resiliently deformed so as to allow the positioning member 28 to recede from the positioning position.
机译:提供了一种能够防止将过大的力施加到被定位的晶片上的定位台,一种配备有这种定位台的凸块形成设备以及使用这种定位台执行的凸块形成方法。朝向定位构件28的晶片2具有接触表面26s,该接触表面26s基本成角度面对晶片保持表面24a。接触表面26s与晶片2的外周区域接触,以使晶片2朝向晶片保持表面24a倾斜地偏置。利用可弹性变形的部件27,使定位部件28与晶片2接触并保持在定位位置。当超过预定大小的偏压力施加到定位构件28时,可弹性变形构件27变得弹性变形,以允许定位构件28从定位位置退避。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号