首页> 外国专利> INSPECTION APPARATUS, AN EXPOSURE DEVICE, AND A METHOD FOR MANUFACTURING A DEVICE, CAPABLE OF INSPECTING A FOREIGN MATERIAL ON A SURFACE OF AN OBJECT USING A CONTROLLER

INSPECTION APPARATUS, AN EXPOSURE DEVICE, AND A METHOD FOR MANUFACTURING A DEVICE, CAPABLE OF INSPECTING A FOREIGN MATERIAL ON A SURFACE OF AN OBJECT USING A CONTROLLER

机译:检查设备,曝光设备和制造设备的方法,能够使用控制器在对象的表面上检查异物

摘要

PURPOSE: An inspection apparatus, an exposure device, and a method for manufacturing a device are provided to inspect a foreign material from a surface of the object using a controller.;CONSTITUTION: An inspection apparatus includes a projector(4), a first light receiver(8), a second light receiver(9), and a controller(11). The projector projects linear light(45) to a surface of an object. The first and second light receivers receive the scattered light from the surface of the object. The controller maintains the position relationship between the projector, the first light receiver, and the second light receiver. The controller determines the presence of the foreign material on the surface based on the intensity distribution of an output signal of the first and second light receivers.;COPYRIGHT KIPO 2010
机译:目的:提供一种检查装置,曝光装置和制造装置的方法,以使用控制器从物体表面检查异物。;组成:检查装置包括投影仪(4),第一灯接收器(8),第二光接收器(9)和控制器(11)。投影仪将线性光(45)投射到物体表面。第一和第二光接收器接收来自物体表面的散射光。控制器维持投影仪,第一光接收器和第二光接收器之间的位置关系。控制器基于第一和第二光接收器的输出信号的强度分布确定表面上是否存在异物。COPYRIGHTKIPO 2010

著录项

  • 公开/公告号KR20100011940A

    专利类型

  • 公开/公告日2010-02-03

    原文格式PDF

  • 申请/专利权人 CANON KABUSHIKI KAISHA;

    申请/专利号KR20090067561

  • 发明设计人 KAWAHARA ATSUSHI;

    申请日2009-07-24

  • 分类号H01L21/027;H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-21 18:33:23

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