首页> 外国专利> METRICS INDEPENDENT AND RECIPE INDEPENDENT FAULT CLASSES

METRICS INDEPENDENT AND RECIPE INDEPENDENT FAULT CLASSES

机译:度量独立和食谱独立故障类别

摘要

A method and apparatus for diagnosing faults. Process data is analyzed using a first metric to identify a fault. The process data was obtained from a manufacturing machine running a first recipe. A fault signature that matches the fault is identified. The identified fault signature was generated using a second metric and/or a second recipe. At least one fault class that is associated with the fault signature is identified.;COPYRIGHT KIPO & WIPO 2010
机译:一种故障诊断方法和装置。使用第一度量分析过程数据以识别故障。从运行第一配方的制造机器获得过程数据。识别与故障匹配的故障签名。使用第二度量和/或第二配方来生成所识别的故障签名。至少确定一种与故障签名相关的故障类别。; COPYRIGHT KIPO和WIPO 2010

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号