首页> 外国专利> VERTICAL TYPE SEMICONDUCTOR DEVICE AND A METHOD FOR FORMING THE SAME, CAPABLE OF REDUCING THE STEP VARIATION BETWEEN A CELL REGION AND A PERIPHERAL CIRCUIT REGION DURING A PLANARIZATION PROCESS

VERTICAL TYPE SEMICONDUCTOR DEVICE AND A METHOD FOR FORMING THE SAME, CAPABLE OF REDUCING THE STEP VARIATION BETWEEN A CELL REGION AND A PERIPHERAL CIRCUIT REGION DURING A PLANARIZATION PROCESS

机译:垂直型半导体器件及其形成方法,能够减少在平面化过程中细胞区域和周边电路区域之间的阶跃变化

摘要

PURPOSE: A vertical type semiconductor device and a method for forming the same are provided to improve the resistance of the device to moisture and contamination by including a moisture proof structure in a dummy word line structure.;CONSTITUTION: A semiconductor substrate(100) includes a cell region(A) and a peripheral circuit region(B). A word line structure(170) vertically stacks a plurality of word lines in the cell region. A semiconductor structure(192) is arranged by passing through the word line structure. A gate insulation layer is arranged between the word line structure and the semiconductor structure. The height of a dummy word line structure(170d) is identical to the height of the word line structure. A moisture proof structure(220) passes through the dummy word line structure.;COPYRIGHT KIPO 2010
机译:目的:提供一种垂直型半导体器件及其形成方法,以通过在伪字线结构中包括防潮结构来提高该器件的防潮性和抗污染性。组成:半导体衬底(100)包括单元区域(A)和外围电路区域(B)。字线结构(170)在单元区域中垂直地堆叠多条字线。通过穿过字线结构来布置半导体结构(192)。栅极绝缘层布置在字线结构和半导体结构之间。伪字线结构(170d)的高度与字线结构的高度相同。防潮结构(220)穿过伪字线结构。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100039919A

    专利类型

  • 公开/公告日2010-04-19

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20080098896

  • 发明设计人 LEE WOON KYUNG;LEE SEUNG JUN;

    申请日2008-10-09

  • 分类号H01L21/336;H01L29/78;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:55

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