首页> 外国专利> PHOTORESIST PATTERN REMOVAL COMPOSITION INCLUDING A NITROGEN-CONTAINING APROTIC POLAR SOLVENT AND AN AMINOETHOXY ETHANOL, AND A FORMATION METHOD OF A METAL PATTERN USING THEREOF

PHOTORESIST PATTERN REMOVAL COMPOSITION INCLUDING A NITROGEN-CONTAINING APROTIC POLAR SOLVENT AND AN AMINOETHOXY ETHANOL, AND A FORMATION METHOD OF A METAL PATTERN USING THEREOF

机译:包含氮的非质子极性溶剂和氨基乙氧基乙醇的光致抗蚀剂除膜组成及其形成金属图案的方法

摘要

PURPOSE: A photoresist pattern removal composition and a formation method of a metal pattern using thereof are provided to easily remove a photoresist pattern from a substrate, and to improve the removal reliability of the photoresist pattern.;CONSTITUTION: A photoresist pattern removal composition contains the following: 5~20wt% of aminoethoxy ethanol; 2~30wt% of polyalkylene oxides compound; 10~30wt% of glycol ether compound; and the balance of nitrogen-containing aprotic polar solvent. The weight average molecular weight of the polyalkylene oxides compound is 50~500. The polyalkylene oxides compound is marked with chemical formula 1. In the chemical formula 1, R is hydrocarbon with the carbon number of 1~4. The nitrogen-containing aprotic polar solvent contains N,N`-dimethylacetamide, N-methylformamide, or N-methylpyrrolidinone.;COPYRIGHT KIPO 2010
机译:用途:提供光刻胶图案去除组合物和使用其的金属图案的形成方法,以容易地从基板上去除光刻胶图案,并提高光刻胶图案的去除可靠性。以下:5〜20wt%的氨基乙氧基乙醇; 2〜30wt%的聚环氧烷化合物; 10〜30wt%的乙二醇醚化合物;其余为含氮非质子极性溶剂。聚环氧烷化合物的重均分子量为50〜500。聚环氧烷化合物用化学式1标记。在化学式1中,R是碳原子数为1〜4的烃。含氮非质子极性溶剂包含N,N`-二甲基乙酰胺,N-甲基甲酰胺或N-甲基吡咯烷酮。; COPYRIGHT KIPO 2010

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