首页> 外国专利> METHOD FOR MANUFACTURING AN IMAGE SENSOR, CAPABLE OF PREVENTING A DARK DEFECT DUE TO PLASMA DAMAGE IN A TRENCH ETCH

METHOD FOR MANUFACTURING AN IMAGE SENSOR, CAPABLE OF PREVENTING A DARK DEFECT DUE TO PLASMA DAMAGE IN A TRENCH ETCH

机译:制造图像传感器的方法,该图像传感器能够防止沟槽蚀刻中由于等离子体损坏而造成的黑暗缺陷

摘要

PURPOSE: A method for manufacturing an image sensor is provided to perform a wet-etch process without attack to a desired inter insulating layer by using a poly film.;CONSTITUTION: A substrate(100) including a pixel region and a peripheral region is prepared. A light sensing unit is formed in the pixel region. An interlayer dielectric layer(120) and a wiring(130) are formed on the substrate in which the light sensing unit is formed. A hard mask pattern(140a) is formed on the interlayer dielectric layer and exposes the interlayer to the outside. The trench etching process is processed through a wet etching of the interlayer dielectric layer on the pixel region. The hard mask pattern is removed.;COPYRIGHT KIPO 2010
机译:目的:提供一种用于制造图像传感器的方法,以通过使用多晶硅膜执行湿法蚀刻工艺而不会侵蚀所需的中间绝缘层。;组成:制备包括像素区域和外围区域的基板(100) 。在像素区域中形成光感测单元。在其中形成有光感测单元的基板上形成层间电介质层(120)和布线(130)。硬掩模图案(140a)形成在层间电介质层上并且将层间暴露于外部。通过湿蚀刻像素区域上的层间介电层来处理沟槽蚀刻工艺。去除了硬掩模图案。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100079259A

    专利类型

  • 公开/公告日2010-07-08

    原文格式PDF

  • 申请/专利权人 DONGBU HITEK CO. LTD.;

    申请/专利号KR20080137686

  • 发明设计人 PARK KANG PIL;

    申请日2008-12-31

  • 分类号H01L27/146;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:17

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