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METHOD FOR PREPARING METAL NANOPATTERNS USING ATOMIC FORCE MICROSCOPE LITHOGRAPHY

机译:原子力显微照相术制备金属纳米粒子的方法

摘要

PURPOSE: A method for preparing metal nano-patterns using an atomic is provided to effectively form a metal nano pattern on a substrate corresponding to a probe of an atomic microscope by forming a resistor film after forming organic intermediate layer. CONSTITUTION: The surface of a substrate is reformed to a negative ion(S10). An organic compound intermediate layer is formed in the reformed substrate surface(S20). The resist including the organic-metallic compound is spread on the organic compound intermediate layer to form a resist film(S30). A voltage is applied between the probe of an atomic force microscope and the substrate to form a nano-pattern on the surface of the substrate(S40). The resist film is removed from the substrate in which the metal nano pattern is formed(S50).
机译:目的:提供一种使用原子制备金属纳米图案的方法,以通过在形成有机中间层之后形成电阻膜来在与原子显微镜的探针相对应的基板上有效地形成金属纳米图案。构成:将基材表面重整为负离子(S10)。在重整的基板表面中形成有机化合物中间层(S20)。将包含有机金属化合物的抗蚀剂铺展在有机化合物中间层上以形成抗蚀剂膜(S30)。在原子力显微镜的探针和基板之间施加电压,以在基板的表面上形成纳米图案(S40)。从形成有金属纳米图案的基板上去除抗蚀剂膜(S50)。

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