GUIDE PLATE ELASTIC BLOCK OF A VERTICAL PROBE CARD WITH AN ELASTIC OPERATION, CAPABLE OF BEING ASSEMBLED WITH A VERTICAL PROBE PIN

摘要

PURPOSE: A guide plate elastic block of a vertical probe card with an elastic operation is provided to accurately test a semiconductor chip by adding a preset pin pressure to the electrode pad of the semiconductor chip.;CONSTITUTION: A vertical contact part is formed on the lower end of a vertical probe pin(20). A contact part on the upper end of the vertical probe pin performs a first elastic operation. When the vertical probe pin, which is assembled in a guide plate elastic block frame(10), is contacted with the electrode pad of a semiconductor chip, an elastic operation is performed by a first pin pressure. An elastic operational body is formed in the guide plate elastic block frame. When the guide plate elastic block frame is contacted with an object, a second elastic operation is performed.;COPYRIGHT KIPO 2010