首页> 外国专利> SOLUTION COMPOSITION FOR A CHEMICAL MECHANICAL POLISHING CAPABLE OF IMPROVING THE WETTING PROPERTY OF A SEMICONDUCTOR SUBSTRATE AND A POLISHING PAD AT A CHEMICAL MECHANICAL POLISHING PROCESS

SOLUTION COMPOSITION FOR A CHEMICAL MECHANICAL POLISHING CAPABLE OF IMPROVING THE WETTING PROPERTY OF A SEMICONDUCTOR SUBSTRATE AND A POLISHING PAD AT A CHEMICAL MECHANICAL POLISHING PROCESS

机译:化学机械抛光解决方案的组成,能够改善化学抛光过程中半导体基体和抛光垫的润湿性能

摘要

PURPOSE: A solution composition for a chemical mechanical polishing is provided to control the generation of a dishing, and to reduce the generation of defects including a scratch.;CONSTITUTION: A solution composition for a chemical mechanical polishing contains amino acid or an amino acid derivative, a surfactant, and an additive accelerating the swelling of an abrasive particle. The additive is capable of controlling the viscosity of the polishing solution. The amino acid or amino acid derivative contain proline, lysine, arginine, N-methylglycine, glycine, or alanine. The surfactant is a non-ionic surfactant.;COPYRIGHT KIPO 2010
机译:目的:提供用于化学机械抛光的溶液组合物,以控制凹陷的产生,并减少缺陷的产生,包括划痕。;组成:用于化学机械抛光的溶液组合物包含氨基酸或氨基酸衍生物,表面活性剂和促进磨粒膨胀的添加剂。添加剂能够控制抛光溶液的粘度。氨基酸或氨基酸衍生物包含脯氨酸,赖氨酸,精氨酸,N-甲基甘氨酸,甘氨酸或丙氨酸。表面活性剂是非离子表面活性剂。; COPYRIGHT KIPO 2010

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