3D MEASURE SYSTEM USING A DUAL WAVE DIGITAL HOLOGRAPHY OF AN OFF-AXIS MODE, WHICH MINIMIZES THE STRUCTURE OF HARDWARE

摘要

PURPOSE: A 3D measure system using a dual wave digital holography of an off-axis mode, which minimizes the structure of hardware is provided to increase a calculating speed in software by applying a single Fourier transform mode in each hologram.;CONSTITUTION: A 3D measure system using a dual wave digital holography of an off-axis mode comprises a first photographing part(41), a second photographing part(42), a first optical source part(10), a second optical source part(20), a first beam splitter(31), a reference mirror(60), a second beam splitter(32), a third beam splitter(33), a fourth beam splitter(34), a first linear polarizer(51), a second linear polarizer(52) and a controller. The first optical source part emits the first linear polarized beam. The second optical source part emits the second linear polarized beam of the different wavelength and the first linear polarized beam. The second beam splitter faces the first linear polarized beam and the second linear polarized beam the reference mirror. The third beam splitter faces the first linear polarized beam and the second linear polarized beam the measurement object. The first linear polarizer is arranged between the first photographing part and fourth beam splitter.;COPYRIGHT KIPO 2011