首页> 外国专利> AUTOMATIC LANDING METHOD, LANDING APPARATUS OF SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPE USING THE SAME

AUTOMATIC LANDING METHOD, LANDING APPARATUS OF SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPE USING THE SAME

机译:自动着陆方法,扫描探针显微镜的着陆装置和使用相同的扫描探针显微镜

摘要

PURPOSE: A method and a device for automatically landing a probe microscope and the probe microscope thereof are provided to divide a landing step despite a condition change, thereby automatically landing a probe. CONSTITUTION: A laser unit applies a Gaussian laser beam to the cantilever of a probe microscope. An image information collecting unit collects reflective light generated on a sample surface by the Gaussian laser beam. A controller obtains average illumination intensity of the reflective light by the collected light. The controller determines an operating profile of the probe according to the average illumination intensity. A landing unit handles the probe according to an operating signal from the controller.
机译:目的:提供一种用于自动着陆探针显微镜的方法和装置及其探针显微镜,以在条件改变的情况下划分着陆步骤,从而自动着陆探针。组成:激光单元将高斯激光束施加到探针显微镜的悬臂上。图像信息收集单元收集由高斯激光束在样品表面上产生的反射光。控制器通过收集的光获得反射光的平均照明强度。控制器根据平均照度确定探针的工作曲线。着陆单元根据来自控制器的操作信号来处理探针。

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