首页> 外国专利> VARIABLE RESISTANCE MEMORY DEVICE AND A FORMING METHOD THEREOF, CAPABLE OF REDUCING THE RESET CURRENT BY REDUCING THE CONTACT AREA BETWEEN THE PHASE VARIATION MATERIAL LAYER AND THE BOTTOM ELETRDOE

VARIABLE RESISTANCE MEMORY DEVICE AND A FORMING METHOD THEREOF, CAPABLE OF REDUCING THE RESET CURRENT BY REDUCING THE CONTACT AREA BETWEEN THE PHASE VARIATION MATERIAL LAYER AND THE BOTTOM ELETRDOE

机译:可变电阻存储器装置及其形成方法,能够通过减小相变材料层和底部电容之间的接触面积来减小复位电流

摘要

PURPOSE: A variable resistance memory device and a forming method thereof are provided to overcome the pitch limitation of photo process by patterning after forming a conductive layer on a plurality of selection components.;CONSTITUTION: A plurality of word lines(130) is formed on a substrate(110). The plurality of word lines is electrically insulated from each other by an element separating layer(120). A plurality of bit lines(195) intersecting the word lines(130) is formed on the substrate. A phase change material layer(180) for performing the memory function is formed between the word line and the bit line.;COPYRIGHT KIPO 2011
机译:目的:提供一种可变电阻存储器件及其形成方法,以克服在多个选择组件上形成导电层后通过构图而进行光工艺的节距限制的问题。组成:在其上形成多条字线(130)基板(110)。多个字线通过元件分离层(120)彼此电绝缘。与字线(130)交叉的多条位线(195)形成在基板上。在字线和位线之间形成用于执行存储功能的相变材料层(180)。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20100099915A

    专利类型

  • 公开/公告日2010-09-15

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20090018488

  • 发明设计人 HA DAE WON;

    申请日2009-03-04

  • 分类号H01L21/8247;H01L27/115;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:54

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