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POLYCRYSTALLINE SILICON THIN FILM TRANSISTOR USING MILC AND METHOD FOR FABRICATING THE SAME

机译:使用milc的多晶硅硅薄膜晶体管及其制造方法

摘要

A polycrystalline silicon thin film transistor using metal induced lateral crystallization and a manufacturing method thereof are provided to perform a property of high performance and high quality and to have a LDD(Lightly Doped Drain) structure by including a region having low resistance and high resistance inside a source region and a drain region. An amorphous silicon layer is formed on an insulation substrate(10). An active region(20c) is formed by patterning the silicon layer. A first crystallization induced metal pattern and a second crystallization induced metal pattern are partly formed in a position in which a source region(25a,60b) and a drain region(25b,60c) of the active region are formed. A part of a top layer of an exposed active layer is etched by using the first crystallization induced metal pattern and the second crystallization induced metal pattern as a mask. The active region made of amorphous silicon is crystallized through a MIC(Metal Induced Crystallization) and MILC(Metal Induced Lateral Crystallization) thermal process using the first crystallization induced metal pattern and the second crystallization induced metal pattern. A gate insulation film and a gate electrode(50) are formed on the crystallized active region.
机译:提供了一种利用金属诱导的横向结晶的多晶硅薄膜晶体管及其制造方法,以通过在内部包括具有低电阻和高电阻的区域来执行高性能和高质量的特性并具有LDD(轻掺杂漏极)结构。源极区和漏极区。在绝缘基板(10)上形成非晶硅层。通过构图硅层形成有源区(20c)。在形成有源区的源极区(25a,60b)和漏极区(25b,60c)的位置部分地形成第一结晶诱导金属图案和第二结晶诱导金属图案。通过使用第一结晶诱导金属图案和第二结晶诱导金属图案作为掩模,蚀刻暴露的有源层的顶层的一部分。使用第一结晶诱导金属图案和第二结晶诱导金属图案,通过MIC(金属诱导结晶)和MILC(金属诱导横向结晶)热处理,使由非晶硅制成的有源区结晶。在结晶的有源区上形成栅绝缘膜和栅电极(50)。

著录项

  • 公开/公告号KR100965980B1

    专利类型

  • 公开/公告日2010-06-24

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20070140097

  • 发明设计人 주승기;송남규;이상주;

    申请日2007-12-28

  • 分类号H01L29/786;H01L21/336;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:04

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