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A method for generating a mask layout imaging errors be avoided for a mask

机译:避免了用于掩模的用于生成掩模布局成像误差的方法

摘要

A method for generating an image errors are avoided, final mask layout (20 '') for a mask (10), in which a generated, provisional auxiliary - mask layout (100) in the final mask layout (20'') with the aid of an opc - method is transferred,– wherein, prior to the carrying out the opc - method with the preliminary auxiliary masks layout (100), first a modified auxiliary masks layout (100 '') is formed,– in that at least one optically not dissolvable auxiliary structure (130) between two mask structures (110, 120) of the preliminary auxiliary masks layout (100) is arranged,characterized in that– the optically not dissolvable auxiliary structure (130) between the two mask structures (110, 120) as a function of the structure size (b1, b2) of the two mask structures (110, 120) is placed, wherein, in the case of different sizes (δb) of the two mask structures are an off-center arrangement (v) of the optically non-dissolvable auxiliary structure (130) between the two mask structures takes place and– the eccentric arrangement (v) of the optically non-dissolvable auxiliary structure (130) is selected in such a manner that the optically not dissolvable auxiliary structure..
机译:避免了用于产生图像错误的方法,即用于掩模(10)的最终掩模布局(20”),其中,在最终掩模布局(20”)中具有所产生的临时辅助掩模布局(100)。转移了一种opc-方法的帮助,–其中,在执行具有初步辅助掩模版图(100)的opc-方法之前,首先形成了一种改进的辅助掩模版图(100''),–至少在初步辅助掩模布局(100)的两个掩模结构(110、120)之间布置一个光学不可溶的辅助结构(130),其特征在于-两个掩模结构(110)之间的光学不可溶的辅助结构(130) ,根据两个掩模结构(110、120)的结构尺寸(b1,b2)放置函数,…,120),其中,在两个掩模结构的尺寸(δb)不同的情况下,偏心布置(v)两个掩模结构之间的光学不可溶解的辅助结构(130) e和–光学不可溶解的辅助结构(130)的偏心轮(v)以光学不可溶解的辅助结构的方式选择。

著录项

  • 公开/公告号DE102004047263B4

    专利类型

  • 公开/公告日2010-04-22

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE20041047263

  • 发明设计人

    申请日2004-09-24

  • 分类号G03F7/20;

  • 国家 DE

  • 入库时间 2022-08-21 18:29:07

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