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Metal covering layer with an increased electrode potential for copper based metal areas, in semiconductor components as well as processes for their preparation

机译:半导体组件及其制备工艺中铜基金属区域的电极电位增加的金属覆盖层

摘要

Semiconductor component with:a substrate;a metallization system, which extends over the substrate is formed, wherein said metallizing system comprisesa metal line, which is designed in a dielectric layer and an upper surface,a conductive cover layer which, on the upper surface is provided, wherein the conductive outer layer is composed of a ternary alloy with tungsten and at least one metal, which is defined by a standard electrode potential, the less is negative in comparison to a standard electrode potential of cobalt (co), wherein the at least one metal aluminum, titanium, gold, silver or platinum comprises.
机译:半导体元件,其具有:衬底;形成在衬底上延伸的金属化系统,其中,所述金属化系统包括设计在介电层​​和上表面中的金属线,在上表面上的导电覆盖层。提供,其中所述导电外层由与钨和至少一种金属的三元合金组成,所述三元合金由标准电极电势限定,与钴(co)的标准电极电势相比,所述负外层为负数少,其中包含铝,钛,金,银或铂中的至少一种金属。

著录项

  • 公开/公告号DE102008016431B4

    专利类型

  • 公开/公告日2010-06-02

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE20081016431

  • 发明设计人

    申请日2008-03-31

  • 分类号H01L23/532;H01L21/768;H01L21/306;

  • 国家 DE

  • 入库时间 2022-08-21 18:29:02

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