首页> 外国专利> Method for irradiating sample with light in stimulated emission depletion-fluorescent light microscope, involves synchronizing polarizations of input light beams to beam splitter such that partial beams interferes in common focus point

Method for irradiating sample with light in stimulated emission depletion-fluorescent light microscope, involves synchronizing polarizations of input light beams to beam splitter such that partial beams interferes in common focus point

机译:在激发发射耗尽型荧光显微镜中用光照射样品的方法,涉及使输入光束的偏振光同步到分束器,以使部分光束干涉公共焦点。

摘要

The method involves using a polarization beam splitter (24) as a beam splitter, and adjusting polarizations of two pairs of partial beams between the polarizing beam splitter and lenses (28, 29) such that the partial beams interfere in a region of a common focal plane (30). Polarizations of input light beams (13, 14) that are different from each other are synchronized to the polarization beam splitter such that one pair of partial beams interferes in a common focus point (22) with a phase that is offset relative to another phase by pi. An independent claim is also included for a fluorescent light microscope comprising a light unit for irradiating a sample with light.
机译:该方法包括使用偏振分束器(24)作为分束器,并调节偏振分束器和透镜(28、29)之间的两对分束的偏振,以使得分束在公共焦点的区域中干涉。飞机(30)。彼此不同的输入光束(13、14)的偏振被同步到偏振分束器,使得一对分光束在公共焦点(22)中干扰相对于另一相位偏移了一个相位的相位。 。还包括用于荧光显微镜的独立权利要求,该荧光显微镜包括用于用光照射样品的照明单元。

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