首页> 外国专利> Microlithographic projection exposure system has lightening system with multi-mirror array for adjusting intensity distribution in pupil level

Microlithographic projection exposure system has lightening system with multi-mirror array for adjusting intensity distribution in pupil level

机译:微光刻投影曝光系统具有带多镜阵列的增亮系统,用于调节瞳孔水平的强度分布

摘要

The microlithographic projection exposure system has a lightening system (10) with a multi-mirror array (22) for adjusting an intensity distribution in a pupil level (30). The lightening system has mirror angle determination electronics, which is designed such that a vector length of the vector is determined. The vector is rotated in a coordinate system successively on the coordinate axis of the coordinate system. An independent claim is included for a method for operating the microlithographic projection exposure system.
机译:该微光刻投影曝光系统具有照明系统(10),该照明系统具有用于调节光瞳水平(30)中的强度分布的多镜阵列(22)。照明系统具有镜角确定电子器件,其设计成使得确定矢量的矢量长度。该矢量在坐标系中在坐标系的坐标轴上连续旋转。包括用于操作微光刻投影曝光系统的方法的独立权利要求。

著录项

  • 公开/公告号DE102008041222A1

    专利类型

  • 公开/公告日2010-02-18

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT AG;

    申请/专利号DE20081041222

  • 发明设计人 MAJOR ANDRAS G.;

    申请日2008-08-13

  • 分类号G03F7/20;

  • 国家 DE

  • 入库时间 2022-08-21 18:28:48

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