首页> 外国专利> Optical arrangement i.e. projection illumination system, operating method for microlithography, involves illuminating lens with light, such that non-uniform temperature distribution is produced in lens to correct defect of system

Optical arrangement i.e. projection illumination system, operating method for microlithography, involves illuminating lens with light, such that non-uniform temperature distribution is produced in lens to correct defect of system

机译:光学装置,即投影照明系统,一种用于微光刻的操作方法,涉及到用光照射透镜,从而在透镜中产生不均匀的温度分布以校正系统的缺陷。

摘要

The method involves determining an image defect of a projection illumination system (1), and illuminating an optical lens of the illumination system with heating light by using a heating light source in such a manner that a non-uniform temperature distribution is produced in the optical lens for correcting the image defect of the illumination system. The illumination of the optical lens with the light takes place with constant or variable radiation power, where wavelength of the light is selected from infrared wavelength spectrum.
机译:该方法包括确定投影照明系统(1)的图像缺陷,以及通过使用加热光源以使得在光学系统中产生不均匀的温度分布的方式用加热光来照明照明系统的光学透镜。镜头,用于校正照明系统的图像缺陷。用恒定或可变的辐射功率对光学透镜进行照明,其中光的波长选自红外波长光谱。

著录项

  • 公开/公告号DE102010003938A1

    专利类型

  • 公开/公告日2010-10-14

    原文格式PDF

  • 申请/专利权人 CARL ZEISS;

    申请/专利号DE20101003938

  • 发明设计人 GRUND THOMAS;

    申请日2010-04-13

  • 分类号G03F7/20;G02B26;

  • 国家 DE

  • 入库时间 2022-08-21 18:28:09

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