DEFECT INSPECTION SYSTEM, AND PHOTOGRAPHING DEVICE FOR DEFECT INSPECTION, IMAGE PROCESSING APPARATUS FOR DEFECT INSPECTION, IMAGE PROCESSING PROGRAM FOR DEFECT INSPECTION, RECORDING MEDIUM, AND IMAGE PROCESSING METHOD FOR DEFECT INSPECTION USED FOR THE SAME

摘要

PROBLEM TO BE SOLVED: To provide an image processing apparatus for defect inspection or the like for detecting various types of defects having different occurring variation in a light route with sufficient accuracy at the same time.;SOLUTION: The image processing apparatus 6 for defect inspection (image analyzer) includes a data extracting part 11 that processes image data obtained by photographing a molding sheet under moving continuously in time by an area camera 5 and extracts line data of the same position from different image data regarding a plurality of different positions on the image data, a data storage part 13 that arranges a plurality of line data in time series at respective positions on the image data and generates a plurality of line composite image data, a variation amount calculation part 15 that applies differential operator operation to the plurality of line composite image data and generates a plurality of enhanced image data, a same part determination extracting part 16 for extracting data indicating the same part of the molding sheet from the plurality of enhanced image data, and an integrating part 17 that integrates luminance values of extracted enhanced image data for each pixel and generates image data for defect inspection.;COPYRIGHT: (C)2011,JPO&INPIT