SEMICONDUCTOR INTEGRATED CIRCUIT, ERROR INSPECTION METHOD, ERROR INSPECTION PROGRAM AND RECORDING MEDIUM

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit, an error inspection method, an error inspection program and a recording medium, for detecting a function module wherein an error occurs of a plurality of function modules with a simple configuration.;SOLUTION: This ASIC (Application Specific Integrated Circuit) 1 is mounted with one error detection circuit Ek, and the error detection circuit Ek performs error detection of the plurality of function modules Ma-Mj performed with serial connection to sequentially perform data processing. In the error detection circuit Ek, a data transfer situation confirmation part 12 confirms a transfer situation of signals exchanged between the successive function modules Ma-Mj and specifies a pair of the successive specific function modules Ma-Mj of monitoring targets, a selector 11 acquires a write command signal MCmd[0] and a data reception signal SCmdAccept transferred between the specific function modules Ma-Mj, and an error occurrence condition comparison part 13 decides the pair of the specific function modules Ma-Mj causing the error occurrence based on the signals.;COPYRIGHT: (C)2011,JPO&INPIT