首页> 外国专利> METHOD AND DEVICE FOR DETERMINING GEOMETRIC PROPERTY OF TEST OBJECT AND OPTICAL PROFILING SYSTEM

METHOD AND DEVICE FOR DETERMINING GEOMETRIC PROPERTY OF TEST OBJECT AND OPTICAL PROFILING SYSTEM

机译:确定测试对象和光学轮廓系统的几何特性的方法和装置

摘要

PROBLEM TO BE SOLVED: To determine a geometric property of a test object based on a spatial relationship between first and second datum surfaces in addition to interferometrically profiling a first and second surface of the test object.;SOLUTION: This invention is characterized by a method for determining a geometric property of a test object. The method includes steps for: interferometrically profiling a first surface of the test object with respect to a first datum surface; interferometrically profiling a second surface of the test object with respect to a second datum surface different from the first datum surface; providing a spatial relationship between the first and second datum surfaces; and calculating the geometric property based on the interferometrically profiled surfaces and the spatial relationship between the first and second datum surfaces. In some embodiments, the spatial relationship can be determined by using calibrated gage blocks or by using a displacement measuring interferometer. A corresponding system is also described.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:除了以干涉法对测试对象的第一和第二表面进行轮廓分析外,还基于第一基准表面和第二基准表面之间的空间关系来确定测试对象的几何特性。用于确定测试对象的几何特性。该方法包括以下步骤:相对于第一基准表面干涉地描绘测试对象的第一表面;相对于不同于第一基准表面的第二基准表面干涉地对测试对象的第二表面进行轮廓分析;提供第一基准面和第二基准面之间的空间关系;以及基于干涉轮廓表面以及第一基准表面和第二基准表面之间的空间关系来计算几何特性。在一些实施例中,可以通过使用校准的量规块或通过使用位移测量干涉仪来确定空间关系。还介绍了一个相应的系统。版权所有:(C)2011,JPO&INPIT

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