首页> 外国专利> GEOMETRICAL PROPERTIES CALCULATING METHOD FOR OBJECT TO BE MEASURED, GEOMETRICAL PROPERTY PROGRAM, AND PROFILE-SHAPE MEASURING INSTRUMENT

GEOMETRICAL PROPERTIES CALCULATING METHOD FOR OBJECT TO BE MEASURED, GEOMETRICAL PROPERTY PROGRAM, AND PROFILE-SHAPE MEASURING INSTRUMENT

机译:待测物体的几何特性计算方法,几何特性程序和轮廓形状测量仪器

摘要

PROBLEM TO BE SOLVED: To automate or semi-automate working for assigning the range used for calculating a geometrical properties of the profile shape from among shape measured data, when calculating the geometrical properties of the profile shape, using the shape measured data of the measured profile shape formed on a surface of an object to be measured.;SOLUTION: This profile-shape measuring instrument 1 is provided with an alignment part 61 for aligning a design data, including a geometrical element for specifying the profile shape with the shape-measured data of the profile shape of an object surface to be measured formed according thereto; and a data range determining part 63 for determining an outer end of a profile shape measured range, formed corresponding to the geometric element from among the shape measured data, based on the position of the outer end of the geometrical element, included in the design data aligned to the shape measured data.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:在计算轮廓形状的几何特性时,使用被测件的形状测量数据,自动或半自动化地工作以从形状测量数据中分配用于计算轮廓形状的几何特性的范围轮廓形状;在轮廓形状测量仪器1上设置有用于对准设计数据的对准部分61,对准部分61包括用于根据所测量的形状指定轮廓形状的几何元素据此形成的被测量物体表面的轮廓形状数据;数据范围确定部分63,用于基于包括在设计数据中的几何元素的外端的位置,从形状测量数据中确定与几何元素相对应地形成的轮廓形状的测量范围的外端。对准形状测量数据。;版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2008116392A

    专利类型

  • 公开/公告日2008-05-22

    原文格式PDF

  • 申请/专利权人 TOKYO SEIMITSU CO LTD;

    申请/专利号JP20060301496

  • 发明设计人 ISHIKAWA SEIYA;

    申请日2006-11-07

  • 分类号G01B5/02;G01B5/00;G01B5/20;G01B5/008;

  • 国家 JP

  • 入库时间 2022-08-21 20:23:53

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