首页> 外国专利> SPECTRAL SENSITIVITY CHARACTERISTIC MEASURING INSTRUMENT AND METHOD OF MEASURING SPECTRAL SENSITIVITY CHARACTERISTIC

SPECTRAL SENSITIVITY CHARACTERISTIC MEASURING INSTRUMENT AND METHOD OF MEASURING SPECTRAL SENSITIVITY CHARACTERISTIC

机译:光谱灵敏度特征测量仪器及测量光谱灵敏度特征的方法

摘要

PROBLEM TO BE SOLVED: To provide a spectral sensitivity characteristic measuring instrument for accurately measuring the spectral sensitivity characteristic of an optical characteristic measuring instrument and a method of measuring a spectral sensitivity characteristic.;SOLUTION: A beam of light emitted from a white light source 11 passes through a sharp-cut filter 12 to turn to beams of light (hereinafter called sharp-cut beams of light) wavelength-biased by the sharp-cut filter 12. Each of the sharp-cut beams is measured by a reference spectrophotometer 13 or an object measuring instrument 14 of a spectral sensitivity characteristic measuring object to calculate the spectral sensitivity characteristic of the measuring instrument 14 by a system controller 15. The system controller 15 includes a memory for storing acquired measurement values and a calculator for calculating the sensitivity characteristics of the measuring instrument 14.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种光谱灵敏度特征测量仪器,用于精确地测量光学特性测量仪器的光谱灵敏度特征以及一种测量光谱灵敏度特征的方法。解决方案:从白光源发射的光束11穿过锐截止滤光片12以转向由锐截止滤光片12偏置的波长的光束(以下称为锐截止光束)。每个锐截止光束由参考分光光度计13或光谱灵敏度特性测量对象的物体测量仪器14,以通过系统控制器15计算测量仪器14的光谱灵敏度特性。系统控制器15包括用于存储获取的测量值的存储器和用于计算传感器的灵敏度特性的计算器测量仪器14 .;版权所有:(C)2012,日本特许厅&INPIT

著录项

  • 公开/公告号JP2011196750A

    专利类型

  • 公开/公告日2011-10-06

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20100062094

  • 发明设计人 MATSUMOTO TETSUO;

    申请日2010-03-18

  • 分类号G01J3/02;

  • 国家 JP

  • 入库时间 2022-08-21 18:22:45

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号