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FAILURE INFLUENCE ANALYSIS DEVICE, APPLICATION SYSTEM, AND FAILURE INFLUENCE ANALYSIS METHOD

机译:故障影响分析装置,应用系统和故障影响分析方法

摘要

PPROBLEM TO BE SOLVED: To properly specify the range of the influence of a failure, in a failure influence analysis device for analyzing the influence of a failure which has occurred in components in a system configured of a plurality of components. PSOLUTION: A failure detection part 121 detects whether any of components configuring a system fails or not. A cause range extraction part 122 extracts other components on which the operation of the components determined to be faulty by the failure detection part 121 depends, and defines them as cause range components. A failure investigation part 123 investigates whether any of the cause range components extracted by the cause range extraction part 122 fails or not. An influence range extraction part 131 extracts the other components whose operation depends on the components determined to be faulty by the failure detection part 121 or the failure investigation part 123, and defines them as influence range components. PCOPYRIGHT: (C)2011,JPO&INPIT
机译:<要解决的问题:为了适当地指定故障影响的范围,在故障影响分析装置中,该故障影响分析装置用于分析在由多个部件构成的系统中的部件中发生的故障的影响。

解决方案:故障检测部分121检测配置系统的任何组件是否发生故障。原因范围提取部分122提取由故障检测部分121确定为有故障的组件的操作所依赖的其他组件,并将它们定义为原因范围组件。故障调查部123调查由原因范围提取部122提取出的原因范围成分中的任一个是否发生故障。影响范围提取部分131提取其操作取决于由故障检测部分121或故障调查部分123确定为有故障的组件的其他组件,并将它们定义为影响范围组件。

版权:(C)2011,日本特许厅&INPIT

著录项

  • 公开/公告号JP2011113122A

    专利类型

  • 公开/公告日2011-06-09

    原文格式PDF

  • 申请/专利权人 MITSUBISHI ELECTRIC CORP;

    申请/专利号JP20090266349

  • 发明设计人 KOIKE KENICHI;

    申请日2009-11-24

  • 分类号G06F11/30;

  • 国家 JP

  • 入库时间 2022-08-21 18:21:42

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