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Electronic component mounting position inspection method and electronic component mounting position inspection equipment

机译:电子零件安装位置检查方法及电子零件安装位置检查设备

摘要

PROBLEM TO BE SOLVED: To provide a method of and device for inspecting an electronic component mounted position capable of efficiently and accurately inspecting the mounted position of an electronic component mounted on an electrode pad by thermo-compression bonding automatically without depending on the individual difference of an inspection person.;SOLUTION: First of all, an observation image of the electrode pad 3 through a transparent mounting substrate 1 by a differential interference microscope 8 is acquired as electronic image data. Then, a circumscribed line circumscribing an aggregate of light and darkness 11 generated by mounting the electronic component 2 is drawn relative to the acquired electronic image data. The center point of a quadrangle formed by the circumscribed line is determined in succession. The center point is used as a representative point C representing the aggregate of light and darkness 11. A position coordinate of the representative point C is determined by using a coordinate system using a prescribed design point R on the electrode pad 3 as the origin. The mounted position of the electronic component 2 to the electrode pad 3 is inspected from an observation image of the differential interference microscope 8.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种用于检查电子部件安装位置的方法和装置,该方法和装置能够通过自动热压结合而自动且高效地且准确地检查安装在电极垫上的电子部件的安装位置,而无需依赖于其个体差异。解决方案:解决方案:首先,通过差分干涉显微镜8获取电极垫3通过透明安装基板1的观察图像作为电子图像数据。然后,相对于所获取的电子图像数据绘制外接线,该外接线外接通过安装电子部件2而产生的明暗集合11。由外接线形成的四边形的中心点是连续确定的。中心点用作代表明暗11的集合的代表点C。代表点C的位置坐标通过使用坐标系来确定,该坐标系以电极垫3上的指定设计点R为原点。从微分干涉显微镜8的观察图像中检查电子部件2到电极垫3的安装位置。版权所有:(C)2007,日本特许厅&INPIT

著录项

  • 公开/公告号JP4750451B2

    专利类型

  • 公开/公告日2011-08-17

    原文格式PDF

  • 申请/专利权人 三菱電機株式会社;

    申请/专利号JP20050109398

  • 申请日2005-04-06

  • 分类号G01B11/00;G09F9/00;H05K3/00;H05K13/08;

  • 国家 JP

  • 入库时间 2022-08-21 18:21:44

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