首页> 外国专利> INSPECTION RESULT ANALYZING METHOD AND INSPECTION RESULT ANALYZING DEVICE, ABNORMAL FACILITY DETECTING METHOD AND ABNORMAL FACILITY DETECTING DEVICE, PROGRAM FOR ENABLING COMPUTER TO EXECUTE INSPECTION RESULT ANALYZING METHOD OR ABNORMAL FACILITY DETECTING METHOD, AND COMPUTER-READABLE RECORDING MEDIUM WHERE PROGRAM IS RECORDED

INSPECTION RESULT ANALYZING METHOD AND INSPECTION RESULT ANALYZING DEVICE, ABNORMAL FACILITY DETECTING METHOD AND ABNORMAL FACILITY DETECTING DEVICE, PROGRAM FOR ENABLING COMPUTER TO EXECUTE INSPECTION RESULT ANALYZING METHOD OR ABNORMAL FACILITY DETECTING METHOD, AND COMPUTER-READABLE RECORDING MEDIUM WHERE PROGRAM IS RECORDED

机译:检查结果分析方法和检查结果分析设备,异常设备检测方法和异常设备检测设备,使计算机执行检查结果分析方法或异常设备检测方法的程序,并记录在计算机中

摘要

PPROBLEM TO BE SOLVED: To provide an inspection result analyzing method for accurately collating in a short time, first substrate in-plane characteristic distribution information representing inspection results of a reference substrate inspected previously in a manufacturing line with second substrate in-plane characteristic distribution information representing inspection results of a target substrate for analysis actually inspected. PSOLUTION: The inspection result analyzing method includes a process in the manufacturing line including the steps of: calculating an angle representing a difference between a first substrate loading direction where the substrate previously inspected for a facility for executing the process is loaded and a second substrate loading direction where the target substrate for analysis is loaded (S101); rotating the second substrate in-plane characteristic distribution information to eliminate the angle (S102); and collating the rotated second substrate in-plane characteristic distribution information with the first substrate in-plane characteristic distribution information (S103). PCOPYRIGHT: (C)2011,JPO&INPIT
机译:

要解决的问题:为了提供一种用于在短时间内准确校对的检查结果分析方法,第一基板面内特性分布信息表示先前在具有第二基板面内的生产线中进行检查的参考基板的检查结果。表示实际检查的分析对象基板的检查结果的特性分布信息。解决方案:检查结果分析方法包括在生产线中进行的处理,该处理包括以下步骤:计算表示第一基板装载方向与先前检查了用于执行该工艺的设备的基板的装载方向之间的差的角度。在第二基板装载方向上装载分析用目标基板(S101)。旋转第二基板面内特性分布信息以消除角度(S102);将旋转后的第二基板面内特性分布信息与第一基板面内特性分布信息进行对照(S103)。

版权:(C)2011,日本特许厅&INPIT

著录项

  • 公开/公告号JP2010272797A

    专利类型

  • 公开/公告日2010-12-02

    原文格式PDF

  • 申请/专利权人 SHARP CORP;

    申请/专利号JP20090125279

  • 发明设计人 IMAI KATSUKI;

    申请日2009-05-25

  • 分类号H01L21/66;H01L21/02;

  • 国家 JP

  • 入库时间 2022-08-21 18:21:24

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