首页>
外国专利>
LAYOUT INSPECTION APPARATUS, LAYOUT INSPECTION METHOD, AND LAYOUT INSPECTION PROGRAM
LAYOUT INSPECTION APPARATUS, LAYOUT INSPECTION METHOD, AND LAYOUT INSPECTION PROGRAM
展开▼
机译:布局检查装置,布局检查方法和布局检查程序
展开▼
页面导航
摘要
著录项
相似文献
摘要
PROBLEM TO BE SOLVED: To provide a layout inspection apparatus for more accurately determining whether a printed board is laid out to reduce noise generated at an IC.;SOLUTION: A first path length calculating unit 12 of the layout inspection apparatus 100A calculates a first path length, which is the shortest conduction path from a power supply pin to a bypass capacitor, based on layout information stored in a storage unit 3. A second path length calculating unit 13 calculates a second path length, which is the shortest conduction path from the power supply pin to a power supply plane, based on the layout information. An evaluation value calculating unit 14 calculates an evaluation value regarding the size of the power supply plane, based on the layout information. A layout determining unit 17 determines that the layout is improper, if the first path length exceeds the second path length and if the evaluation value of the power supply plane exceeds a predetermined reference value.;COPYRIGHT: (C)2011,JPO&INPIT
展开▼