PROBLEM TO BE SOLVED: To improve the debugging efficiency and test quality of software for a microcomputer apparatus.;SOLUTION: A test pattern generation part 110 in a debugging support host program 100 generates a status transition pass from a status transition table 1 and supposed events and unexpected events for respective states of the status transition pass as test patterns, and an event issue part 210 in a debugging support target program 200 issues all unexpected events in respective states of the status transition pass before the supposed events by using the test patterns.;COPYRIGHT: (C)2007,JPO&INPIT
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