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Being the film thickness measurement equipment which measures the film thickness of the film thickness measurement equipment

机译:作为测量膜厚测量设备的膜厚的膜厚测量设备

摘要

PROBLEM TO BE SOLVED: To accurately measure film thickness in a simple composition in an optical film thickness measuring device for organic EL optically measuring the film thickness.;SOLUTION: The film thickness measuring device for measuring the film thickness of an organic thin film deposited on a structure comprises: a means for projecting irradiation light of prescribed wavelength on the structure during at least deposition; a means for detecting reflective light intensity or transmission light intensity from the structure to the irradiation light; and a means for specifying the film thickness of the organic thin film based on the reflective light intensity or the transmission light intensity. Absorption spectrum of the organic substance composing the organic thin film is included in a wavelength range giving absorbance in which the prescribed wavelength is 20% or less to a peak value of absorbance, preferably 10% or less.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:在用于有机EL的光学膜厚测量装置中,以简单的组成准确地测量膜厚,以光学方式测量膜厚。一种结构,包括:至少在沉积过程中将规定波长的照射光投射到结构上的装置;用于检测从结构到照射光的反射光强度或透射光强度的装置;根据反射光强度或透射光强度确定有机薄膜的膜厚的装置。构成有机薄膜的有机物质的吸收光谱包含在给出吸光度的波长范围内,其中规定波长为吸光度的峰值的20%或更小,优选为10%或更小; COPYRIGHT:(C)2008,日本特许厅

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