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Applying the resist liquid to the application and development device and application and development

机译:将抗蚀剂液涂布到涂布显影装置及涂布显影中

摘要

PROBLEM TO BE SOLVED: To suppress bad influence with respect to a resolving of resist pattern which is caused by waterdrop left on a substrate by liquid immersion exposure in an exposure device performing development treatment with respect to the substrate after carrying out the liquid immersion exposure by forming resist film in the substrate.;SOLUTION: By aiming up a phenomenon in which the water drop attached to the substrate rapidly decreases in size when a certain time has passed, and a deterioration layer (watermark) is formed in the resist film of the substrate, the substrate is processed in conveyance control so that the substrate may be cleaned in a cleaning portion in a time zone before entering a time zone during which a size of the waterdrop rapidly decreases in size after the liquid immersion exposure. In concrete, when a carrying out preparation signal is outputted from the exposure device, substrate conveyance means of interface portion are prior to other conveyance work, and convey the substrate on a conveyance stage to the cleaning portion.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:在通过对基板进行显影处理后,对基板进行显影处理的曝光装置中,抑制因液浸曝光而残留在基板上的水滴引起的对抗蚀剂图案的解析的不良影响。解决方案:通过解决以下现象:当经过一定时间后,附着在基板上的水滴尺寸迅速减小,并在基板的抗蚀剂膜上形成劣化层(水印)。在基板上,在输送控制中对基板进行处理,使得可以在进入液体浸没曝光后水滴的尺寸迅速减小的时间段之前的一定时间段内的清洗区域中清洗基板。具体而言,当从曝光装置输出执行准备信号时,接口部的基板搬送单元在进行其他搬送作业之前,将基板在搬送台上搬送到清洁部。(C)2007,日本特许厅

著录项

  • 公开/公告号JP4654120B2

    专利类型

  • 公开/公告日2011-03-16

    原文格式PDF

  • 申请/专利权人 東京エレクトロン株式会社;

    申请/专利号JP20050355285

  • 发明设计人 山本 太郎;石田 省貴;

    申请日2005-12-08

  • 分类号H01L21/027;G03F7/30;B05C9/12;B05C9/14;B05C13/02;

  • 国家 JP

  • 入库时间 2022-08-21 18:19:04

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