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At the time of epitaxial wafer production at the time of hydrogen etching in graduation of the silicon carbide substrate in order to remove the grinding damage of the surface production manner
At the time of epitaxial wafer production at the time of hydrogen etching in graduation of the silicon carbide substrate in order to remove the grinding damage of the surface production manner
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机译:为了去除表面生产方式的研磨损伤,在碳化硅衬底的刻度中进行氢蚀刻时的外延晶片生产时
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摘要
PROBLEM TO BE SOLVED: To provide a manufacturing method of a silicon carbide smoothed substrate to be used in manufacturing an epitaxial wafer participating in the crystal growth of silicon carbide, and to provide the silicon carbide smoothed substrate, a silicon carbide epitaxial wafer, a gallium nitride wafer and a semiconductor manufacturing device.;SOLUTION: In the manufacturing method of the silicon carbide smoothed substrate of this invention, a raw material gas (silane) is added during hydrogen etching in smoothing of a silicon carbide substrate.;COPYRIGHT: (C)2006,JPO&NCIPI
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