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At the time of epitaxial wafer production at the time of hydrogen etching in graduation of the silicon carbide substrate in order to remove the grinding damage of the surface production manner

机译:为了去除表面生产方式的研磨损伤,在碳化硅衬底的刻度中进行氢蚀刻时的外延晶片生产时

摘要

PROBLEM TO BE SOLVED: To provide a manufacturing method of a silicon carbide smoothed substrate to be used in manufacturing an epitaxial wafer participating in the crystal growth of silicon carbide, and to provide the silicon carbide smoothed substrate, a silicon carbide epitaxial wafer, a gallium nitride wafer and a semiconductor manufacturing device.;SOLUTION: In the manufacturing method of the silicon carbide smoothed substrate of this invention, a raw material gas (silane) is added during hydrogen etching in smoothing of a silicon carbide substrate.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种用于制造参与碳化硅的晶体生长的外延晶片的碳化硅平滑衬底的制造方法,并提供该碳化硅平滑衬底,碳化硅外延晶片,镓氮化物晶片和半导体制造装置;解决方案:在本发明的碳化硅平滑衬底的制造方法中,在碳化硅衬底的平滑处理中的氢蚀刻期间添加原料气体(硅烷)。 )2006,日本特许厅

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