Evaluation device of tamper-resistant countermeasure circuit, evaluation method of tamper-resistant countermeasure circuit, signal generation circuit, signal generating method, tamper-resistant evaluation device and tamper-resistance evaluation method

摘要

PROBLEM TO BE SOLVED: To provide a method to inspect the existence of an information leak or non-existence when the function of a tamper resistant countermeasure circuit in a semiconductor device is made valid, or is made invalid in the same circuit without changing the semiconductor device, and to evaluate an effect of the tamper resistant countermeasure circuit; and to easily specify a circuit from which secret information leaks by measuring power consumption for a tamper resistant nature evaluation, by limiting the measurement to a specific circuit of the semiconductor device.;SOLUTION: A selection circuit selects the case which makes a function of the tamper resistant countermeasure circuit for preventing an information leak which exhibits by analyzing the power consumption of the circuit valid or the case which makes invalid. A signal creation circuit creates a 2nd standard signal which makes the 2nd part of the circuit operate in different timing from the 1st part of the circuit based on a 1st standard signal which makes the 1st part of the circuit operate.;COPYRIGHT: (C)2006,JPO&NCIPI