首页> 外国专利> ELECTRONIC DEVICE INCLUDING A DOPED REGION DISPOSED UNDER AND HAVING A HIGHER DOPANT CONCENTRATION THAN A CHANNEL REGION AND A PROCESS OF FORMING THE SAME

ELECTRONIC DEVICE INCLUDING A DOPED REGION DISPOSED UNDER AND HAVING A HIGHER DOPANT CONCENTRATION THAN A CHANNEL REGION AND A PROCESS OF FORMING THE SAME

机译:电子设备,其中包括掺杂区,该掺杂区位于通道区域以下并且具有比通道区域更高的掺杂剂浓度,并且形成相同区域的过程

摘要

An electronic device can include a drain region of a transistor, a channel region of the transistor, and a doped region that is disposed under substantially all of the channel region, is not disposed under substantially all of a heavily doped portion of the drain region, and has a higher dopant concentration compared to the channel region. A process of forming an electronic device can include forming a drain region, a channel region, and a doped region, wherein the drain region has a conductivity type opposite that of the channel and doped region. After forming the drain, channel, and doped regions, the doped region is disposed under substantially all of the channel region, the doped region is not disposed under substantially all of a heavily doped portion of the drain region, and the drain region is laterally closer to the doped region than to the channel region.
机译:电子设备可以包括:晶体管的漏极区域,晶体管的沟道区域以及设置在基本上所有沟道区域下方,但不基本上在漏极区域的所有重掺杂部分下方的掺杂区域,并且与沟道区相比具有更高的掺杂剂浓度。形成电子器件的工艺可以包括形成漏极区,沟道区和掺杂区,其中,漏极区具有与沟道区和掺杂区相反的导电类型。在形成漏极,沟道和掺杂区之后,将掺杂区设置在基本上所有沟道区的下方,将掺杂区不设置在漏极区的基本上所有重掺杂区的下方,并且漏极区横向地更靠近掺杂区而不是沟道区。

著录项

  • 公开/公告号US2011193177A1

    专利类型

  • 公开/公告日2011-08-11

    原文格式PDF

  • 申请/专利权人 GARY H. LOECHELT;

    申请/专利号US20100702072

  • 发明设计人 GARY H. LOECHELT;

    申请日2010-02-08

  • 分类号H01L29/78;H01L21/336;

  • 国家 US

  • 入库时间 2022-08-21 18:16:23

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