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Normal incidence ellipsometer with complementary waveplate rotating compensators

机译:具有入射波片旋转补偿器的垂直入射椭圆仪

摘要

In embodiments of the present invention a second, different waveplate is introduced into a single rotating compensator normal incidence ellipsometer. The second waveplate provides a quarter wavelength retardation that is different from and complementary to that of the first waveplate in order to increase the spectral range for which useful retardation is available, especially towards the deep UV spectrum. The sensitivity for the system may also be increased in the conventional spectral range, since each of the two waveplates may be optimized for its own, somewhat more narrow spectral range of operation. With the proper choice of two waveplates of different retardation, the useful spectral range may be extended from typically 190-820 nm to 150-1000 nm, and beyond if necessary, while increasing the sensitivity within the conventional wavelength range at the same time.
机译:在本发明的实施例中,将不同的第二波片引入单个旋转补偿器法向入射椭圆仪中。第二个波片提供与第一个波片不同的四分之一波长延迟,并且与之互补,以便增加可用的延迟可用的光谱范围,尤其是对深紫外光谱而言。该系统的灵敏度也可以在常规光谱范围内增加,因为两个波片中的每个可以针对其自身的,稍微更窄的光谱范围进行优化。具有不同相位差的2个波片的正确选择,有用的光谱范围可以从典型地190-820纳米至150-1000纳米进行扩展,及以后如果需要的话,同时增加在同一时间的以往的波长范围内的敏感性。

著录项

  • 公开/公告号US7889340B1

    专利类型

  • 公开/公告日2011-02-15

    原文格式PDF

  • 申请/专利权人 KLAUS FLOCK;JEFF T. FANTON;

    申请/专利号US20080170371

  • 发明设计人 JEFF T. FANTON;KLAUS FLOCK;

    申请日2008-07-09

  • 分类号G01J4/00;

  • 国家 US

  • 入库时间 2022-08-21 18:09:42

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