首页> 外国专利> Optical lattice microscopy using periodic interference patterns of coherent waves

Optical lattice microscopy using periodic interference patterns of coherent waves

机译:使用相干波的周期性干涉图样的光学晶格显微镜

摘要

A microscope includes a source of electromagnetic radiation, having a wavelength, λ1 and dividing optical elements configured for dividing the radiation from the source into multiple excitation beams. The microscope also includes a detector and directing optical elements, which are configured for directing each excitation beam in unique directions, such that the beams intersect in an excitation region within a sample to create a two-dimensional or three-dimensional interference pattern of multiple excitation maxima within the sample. The detector has individual detector elements, where the detector elements are configured for detecting light resulting from an interaction of an individual excitation maximum and the sample.
机译:显微镜包括电磁辐射源,其具有波长λ 1 ,以及划分光学元件,该光学元件被配置为将来自该源的辐射划分为多个激发光束。显微镜还包括检测器和定向光学元件,其被配置为将每个激发光束引导到唯一的方向,以使光束在样品内的激发区域中相交,以产生多次激发的二维或三维干涉图样。样本内的最大值。该检测器具有单独的检测器元件,其中该检测器元件被配置用于检测由单个激发最大值和样品的相互作用产生的光。

著录项

  • 公开/公告号US7990611B2

    专利类型

  • 公开/公告日2011-08-02

    原文格式PDF

  • 申请/专利权人 ROBERT ERIC BETZIG;

    申请/专利号US20070719930

  • 发明设计人 ROBERT ERIC BETZIG;

    申请日2007-05-22

  • 分类号G02B21/06;

  • 国家 US

  • 入库时间 2022-08-21 18:09:37

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号