首页> 外国专利> Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope

Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope

机译:提供用于在探针显微镜中对测试样品进行探针显微镜分析的探针的方法以及具有探针显微镜的装置

摘要

The present invention relates to a method for providing a measuring probe (1, 1a, 2) for a probe microscopic examination of a sample in a probe microscope, in particular a scanning probe microscope, in which the measuring probe (1), which has a probe base (1a) and a probe extension (2) formed thereon, is held on a carrier device and the measuring probe (1) is processed before or after a measurement by detaching a section of the probe extension (2). The invention further relates to an arrangement having a probe microscope for the probe microscopic examination of a sample, in particular a scanning probe microscope.
机译:本发明涉及一种提供测量探针( 1、1 a, 2 )的方法,该探针用于显微镜检查样品中的样品。探针显微镜,特别是扫描探针显微镜,其中测量探针( 1 )具有探针底座( 1 a )并且在其上形成的探针延伸部分( 2 )被保持在一个载体设备上,并且在测量之前或之后通过分离一部分的探针来处理测量探针( 1 )。探针扩展名( 2 )。本发明还涉及一种具有探针显微镜的装置,该探针显微镜用于样品的探针显微镜检查,特别是扫描探针显微镜。

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