AN EMBEDDED SYSTEM FOR ANALYSIS OF MICROSTRIP-LIKE INTERCONNECTS

摘要

Disclosed are computing device and methods for computing electrical characteristics of interconnect lines. The computing device includes at least one processor and at least one memory comprising computer program code. The at least one memory and the computer program code configured to, with the at least one processor, cause the computing device to receive interconnect input associated with an interconnect line and calculate a Green's function corresponding to the geometrical dimensions. The interconnect input includes geometrical dimensions of the interconnect line and at least one material constant. The Green's function is calculated using transverse transmission line technique. Furthermore, the at least one memory and the computer program code configured to, with the at least one processor, cause the computing device at least to compute one or more electrical characteristics of the interconnect line based on at least one of the geometrical dimension, the Green's function and a variational analysis.