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VERFAHREN UND VORRICHTUNG ZUR DICHTHEITSPRÜFUNG VON BAUWERKSABDICHTUNGEN

机译:密封件泄漏测试的方法和装置

摘要

- 40 - AbstractThe invention relates to a method for determining damaged or faulty points, in particular weak points with a reduced5 material thickness in a membrane-type, electrically non conductive or only poorly conductive structural seal (3) having a high electrical disruptive strength in comparison toair, said seal is provided with an electrically conductive layer (6) arranged inside or outside the structural seal (3)10 and 'extends over substantially the entire surface of the structural seal and to which layer an electrical test voltageis applied. To establish said damaged, faulty and/or weak points, a further electrically conductive layer (7) is used, which is electrically separated from the aforementioned15 electrically conductive layer (6) by the structural seal and extends over substantially the entire surface of thestructural seal. The level of the test voltage between the electrically conductive layers (6, 7) charged with voltage is selected such that when at least one electrically non 20 conductive damaged, faulty and/or weak point is present in the structural seal, the electrical disruptive strength isexceeded and an electric spark or arc being formed at the location of the damaged, faulty and/or weak point, wherein the test voltage being selected to be smaller than a destructive25 test voltage at which an electrical breakdown would result in an undamaged and/or un-weakened structural seal corresponding to the structural seal (3) to be tested, thereby forming an .electric spark ore arc. Also claimed is a correspondingly designed structural seal (3).30
机译:-40- 抽象用于确定损坏或故障点的方法技术领域本发明涉及一种用于确定损坏或故障点,尤其是具有减小的缺陷的方法。与具有较高的抗电强度的膜片型,不导电或仅导电不良的结构密封件(3)相比,具有5的材料厚度空气,所述密封件设置有布置在结构密封件(3)内部或外部的导电层(6)如图10所示,并且'基本上在结构密封件的整个表面上延伸,并且电测试电压延伸到该层上被申请;被应用。为了确定所述损坏的,有缺陷的和/或薄弱的点,使用了另外的导电层(7),其与前述的电分离。15导电层(6)通过结构密封并基本上在整个表面上延伸结构密封。选择充有电压的导电层(6、7)之间的测试电压电平,使得当至少一个不导电时结构密封中存在20个导电损坏,故障和/或弱点,抗电强度为超过,并在损坏,故障和/或弱点的位置形成电火花或电弧,其中选择的测试电压小于破坏性电压25的测试电压,在该电压下电击穿会导致对应于要测试的结构密封件(3)的结构密封件没有损坏和/或没有损坏,从而形成。电火花矿弧。还要求一种相应设计的结构密封件(3)。30

著录项

  • 公开/公告号SG168282A1

    专利类型

  • 公开/公告日2011-02-28

    原文格式PDF

  • 申请/专利权人 PROGEO MONITORING GMBH;

    申请/专利号SG2011004173

  • 发明设计人 RÖDEL ANDREAS;KOMMA NORBERT;

    申请日2009-07-20

  • 分类号

  • 国家 SG

  • 入库时间 2022-08-21 18:04:07

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