SYSTEM AND METHOD TO DETERMINE CHROMATIC DISPERSION IN SHORT LENGTHS OF WAVEGUIDES USING A 3-WAVE INTERFERENCE PATTERN AND A SINGLE-ARM INTERFEROMETER

摘要

The present invention relates to a system and method to determine chromatic dispersion in short lengths of waveguides using a three wave interference pattern and a single-arm interferometer. Specifically the invention comprises a radiation source operable to emit radiation connected to a means for separating incident and reflected waves; the means for separating incident and reflected waves having an output arm adjacent to a first end of the waveguide; the means for separating incident and reflected waves connected to a detector; a collimating means positioned at a second end of the waveguide; and a reflecting means positioned at a balanced distance from the collimating means operable to reflect a test emission from the radiation source back through the collimating means, the waveguide, and the means for separating incident and reflected waves thereby generating an interference pattern that is recorded by the detector.