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OPERATING METHOD OF A NONVOLATILE MEMORY DEVICE, CAPABLE OF PREVENTING THE REDUCTION OF EFFECTIVE STORAGE CAPACITY

机译:一种非易失性存储器的操作方法,能够防止有效存储容量的减少

摘要

PURPOSE: An operating method of a nonvolatile memory device is provided to manage a bad block more efficiently by processing an ECC(Error Correction Circuit) according to the number of error bits.;CONSTITUTION: A memory cell array(102) comprises 1024 memory blocks. A controller(112) generates a program command signal according to a signal which is received from an IO buffer(118). A high voltage generator(110) generates a bias voltage in response to the program command, an erase command, and a read command. An address generator(120) generates a column address signal. An X-decoder(104) supplies the bias voltage to one of the memory blocks.;COPYRIGHT KIPO 2011
机译:目的:提供一种非易失性存储装置的操作方法,以通过根据错误比特的数目处理ECC(纠错电路)来更有效地管理坏块。;组成:存储单元阵列(102)包括1024个存储块。控制器(112)根据从IO缓冲器(118)接收到的信号来生成程序命令信号。高压发生器(110)响应于编程命令,擦除命令和读取命令而产生偏置电压。地址产生器(120)产生列地址信号。 X解码器(104)将偏置电压提供给其中一个存储块。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20100129068A

    专利类型

  • 公开/公告日2010-12-08

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090047824

  • 发明设计人 HAN JUNG CHUL;JEONG BYOUNG KWAN;

    申请日2009-05-29

  • 分类号G11C16/34;G11C16/06;G11C29/42;

  • 国家 KR

  • 入库时间 2022-08-21 17:53:12

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