首页> 外国专利> APPARATUS FOR ALIGNING MASK AND A METHOD FOR ALIGNING A MASK, CAPABLE OF SUPPRESSING THE INCREASE IN MANUFACTURING COSTS AND A TIMES IN REALIGNMENT OF THE MASK

APPARATUS FOR ALIGNING MASK AND A METHOD FOR ALIGNING A MASK, CAPABLE OF SUPPRESSING THE INCREASE IN MANUFACTURING COSTS AND A TIMES IN REALIGNMENT OF THE MASK

机译:能够掩盖制造成本和实现掩盖次数的能力的掩盖别名的设备和掩盖别名的方法

摘要

PURPOSE: An apparatus for aligning mask and a method for aligning a mask are provided to prevent the alignment error of a mask to a substrate by comparing each alignment state and using corrected alignment value.;CONSTITUTION: In an apparatus for aligning mask and a method for aligning a mask, a mask is arranged on a first substrate and is firstly aligned(S101). Alignment error is detected by measuring the alignment state of a mask to the first substrate(S102). The mask is secondly aligned to the first substrate based on the alignment error(S103). A first substrate is transferred to a next process(S1014). The mask is thirdly aligned to a second substrate(S105). The mask is contacted with the second substrate(S106).;COPYRIGHT KIPO 2011
机译:目的:提供一种用于对准掩模的装置和一种用于对准掩模的方法,以通过比较每个对准状态并使用校正后的对准值来防止掩模与基板的对准误差。组成:在一种用于对准掩模的装置和方法中为了对准掩模,将掩模布置在第一基板上并且首先对准(S101)。通过测量掩模相对于第一基板的对准状态来检测对准误差(S102)。其次,基于对准误差将掩模对准第一基板(S103)。将第一基板转移到下一处理(S1014)。第三,将掩模对准第二基板(S105)。使掩模与第二基板接触(S106)。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110033726A

    专利类型

  • 公开/公告日2011-03-31

    原文格式PDF

  • 申请/专利权人 SAMSUNG MOBILE DISPLAY CO. LTD.;

    申请/专利号KR20090091321

  • 发明设计人 KIM HYUNG MIN;CHUNG KYUNG HOON;

    申请日2009-09-25

  • 分类号H01L51/56;H05B33/10;

  • 国家 KR

  • 入库时间 2022-08-21 17:52:15

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