TEST DEVICE WITH A PROBE CARD AND TEST METHOD USING THE SAME CAPABLE OF SHORTENING THE ENTIRE PROCESSING TIME

摘要

PURPOSE: A test device with a probe card and test method using the same are provided to shorten test time by a configuration of a probe card, thereby increasing productivity. ;CONSTITUTION: A test controller(1) outputs a plurality of chip selection signals, a plurality of first control signals, and a plurality of second control signals. The chip selection signals select chips to be tested. The first control signals control the supply of power supply voltages into chips selected by the chip selection signals. The second control signals control the receiving of the test voltages outputted from the chips. A test block includes a plurality of signal transmitting units. The test block transfers a power voltage to a chip corresponding to a different first control signal or transfers a test voltage outputted from a chip corresponding to a different second control signal to a test controller.;COPYRIGHT KIPO 2011