首页> 外国专利> ELECTROSTATIC DISCHARGE PROTECTION DEVICE FOR A SEMICONDUCTOR DEVICE AND LAYOUT METHOD THEREOF CAPABLE OF INCREASING ELECTROSTATIC DISCHARGE PERFORMANCE

ELECTROSTATIC DISCHARGE PROTECTION DEVICE FOR A SEMICONDUCTOR DEVICE AND LAYOUT METHOD THEREOF CAPABLE OF INCREASING ELECTROSTATIC DISCHARGE PERFORMANCE

机译:半导体装置的静电放电保护装置及其可提高静电放电性能的布局方法

摘要

PURPOSE: An electrostatic discharge protection device for a semiconductor device and layout method thereof are provided to deform the drain of an NMOSFET in an LVTSCR(Low Voltage Triggered Silicon Controlled Rectifier) structure, thereby reducing parasitic capacitance. ;CONSTITUTION: An N well region(250) is formed on a semiconductor substrate. A plurality of P well regions(210,220,230,240) is formed on the circumference which forms the N well region. A source region(260) is connected to the P well regions. A drain region(280) is formed on side of the N well region. A gate region(270) is connected to the P well regions.;COPYRIGHT KIPO 2011
机译:目的:提供一种用于半导体器件的静电放电保护器件及其布局方法,以使NMOSFET的漏极以LVTSCR(低压触发的硅可控整流器)结构变形,从而减小寄生电容。组成:在半导体衬底上形成N阱区(250)。在形成N阱区域的圆周上形成多个P阱区域(210,220,230,240)。源极区(260)连接到P阱区。在N阱区的一侧上形成漏极区(280)。栅极区域(270)连接到P阱区域。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110070001A

    专利类型

  • 公开/公告日2011-06-24

    原文格式PDF

  • 申请/专利权人 DONGBU HITEK CO. LTD.;

    申请/专利号KR20090126629

  • 发明设计人 PARK JAE YOUNG;JANG CHANG SOO;

    申请日2009-12-18

  • 分类号H01L23/60;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:40

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