首页> 外国专利> PELLICLE FOR LITHOGRAPHY CAPABLE OF SUPPRESSING THE TWISTING PHENOMENON OF A MASK BASED ON THE SUPERIOR FLATNESS OF AN ADHESIVE LAYER

PELLICLE FOR LITHOGRAPHY CAPABLE OF SUPPRESSING THE TWISTING PHENOMENON OF A MASK BASED ON THE SUPERIOR FLATNESS OF AN ADHESIVE LAYER

机译:基于胶粘剂层的超平度可抑制面膜扭曲现象的光刻技术

摘要

PURPOSE: A pellicle for lithography is provided to suppress the deformation of a mask due to the attachment of the pellicle by pressurizing a pellicle frame based on a uniform pressure when the pellicle is attached to the mask.;CONSTITUTION: A film adhesive(4) is formed at one side of a pellicle frame(2). A pellicle film(3) is bonded to the pellicle frame based on the adhesive. An adhesion layer(5) is formed at another side of the pellicle frame. The surface flatness of the adhesive layer is less than or equal to 10 um. A separator is attached to the adhesion layer. A concavo-convex part is capable of being formed on both sides of the pellicle frame.;COPYRIGHT KIPO 2011
机译:目的:提供一种光刻用防护膜,通过在将防护膜连接到掩模上时以均匀的压力对防护膜框架施加压力,从而抑制由于防护膜的附着而引起的掩模变形。组成:薄膜胶粘剂(4)在防护薄膜组件框架(2)的一侧形成有齿。防护膜(3)通过粘接剂粘接在防护膜框架上。在防护膜框架的另一侧形成有粘接层(5)。粘合剂层的表面平整度小于或等于10μm。隔板附接到粘附层。可以在防护膜框架的两侧形成凹凸部。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110092233A

    专利类型

  • 公开/公告日2011-08-17

    原文格式PDF

  • 申请/专利权人 SHIN-ETSU CHEMICAL CO. LTD.;

    申请/专利号KR20110010664

  • 发明设计人 SHIRASAKI TORU;

    申请日2011-02-07

  • 分类号G03F1/14;H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:15

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