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REDUNDANCY DATA STORING CIRCUIT, A REDUNDANCY DATA CONTROL METHOD AND A REPAIR DETERMINATION CIRCUIT OF A SEMICONDUCTOR MEMORY, CAPABLE OF IMPROVING REPAIR WORK EFFICIENCY
REDUNDANCY DATA STORING CIRCUIT, A REDUNDANCY DATA CONTROL METHOD AND A REPAIR DETERMINATION CIRCUIT OF A SEMICONDUCTOR MEMORY, CAPABLE OF IMPROVING REPAIR WORK EFFICIENCY
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机译:冗余数据存储电路,冗余数据控制方法和能够提高修复工作效率的半导体存储器的修复确定电路
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摘要
PURPOSE: A redundancy data storing circuit, a redundancy data control method and the repair determination circuit of a semiconductor memory are provided to perform repair of a fail cell after packing by enabling the change and rewriting of a repair address.;CONSTITUTION: In a redundancy data storing circuit, a redundancy data control method and the repair determination circuit of a semiconductor memory, a redundancy data storage(210) stores redundancy data. The redundancy data storage module outputs pre-stored redundancy data as a redundancy address. The redundancy data activation unit(220) outputs pre-stored redundancy data as a redundancy enable signal. A plurality of address comparison parts(230) compares the redundancy address with the column address. A determining unit(240) outputs a repair determination signal.;COPYRIGHT KIPO 2012
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