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immutable characteristic portion having a surface for long objects absolute position of the tip of a decision to a method and apparatus

机译:一种具有不变性的特征部分,该表面具有用于长物体的尖端的绝对位置的决定方法和装置

摘要

The present invention is an absolute stance and tip touching the tip of a long object on a flat surface with invariant features provides a method for determining a position. The method comprises a step of detecting the light scattered back to the sensing object at an angle to the axis of the exploration phase illuminating light on the surface and the invariant feature portion, a long object. The position of the object is derived from the reaction of the scattered light to the invariant portion and surface characteristics. The absolute position of the tip to the surface is obtained from the attitude and constant characterizing part. Method and apparatus for practicing the invention is very diverse. In some cases, the sensing light from the object is directed toward the surface at an angle with respect to the axis of a long object. Alternatively, the angle is the place to be in inverse scattering inverse scattering angle scattering. Angle to the axis of a long object, it is convenient, such as angle . In addition, this reaction to obtain the absolute position may be a change in intensity of the scattered light or scattered light station. Exploration light is preferably directed to a surface with invariant features aimed scanning beam shape. Scan angle light beam is directed exploration varies gets the scanning beam along the scan pattern. This angle change can be made by a scanner having a one-axis or two-axis scan mirror and the driver, but are not limited to FIG. Depending on the case, the scanning pattern is one-axis or two-axis scan pattern scan pattern, a two-axis scan pattern is a suitable pattern is a raster or Lissajous figures.
机译:本发明是一种绝对姿势,并且尖端以不变的特征接触平坦表面上的长物体的尖端提供了一种确定位置的方法。该方法包括以下步骤:检测相对于探索阶段的轴线成一定角度散射回传感对象的光,从而在表面和不变特征部分(长对象)上照明光。物体的位置是由散射光对不变部分的反应和表面特性得出的。尖端相对于表面的绝对位置是从姿态和恒定特征部分获得的。用于实施本发明的方法和设备非常多样化。在某些情况下,来自物体的感测光相对于长物体的轴以一定角度指向表面。可替代地,该角度是逆散射逆散射角散射的地方。与长物体的轴成角度,这很方便,例如angle。另外,这种获得绝对位置的反应可以是散射光或散射光站的强度变化。探测光优选地被引导至具有针对扫描光束形状的不变特征的表面。扫描角光束被定向探查沿扫描图案变化得到扫描光束。可以通过具有一轴或两轴扫描镜的扫描仪和驱动器来进行该角度改变,但不限于图1。根据情况,扫描图案是一轴或两轴扫描图案的扫描图案,两轴扫描图案是合适的图案是光栅或李沙育图形。

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